ATML defines a standard exchange medium for sharing test related information. This exchange may be between components of Automatic Test Systems (ATS), or between ATS and external systems. ATML supports test program, test asset and Unit Under Test (UUT) interoperability within the automatic test environment. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the extensible markup language (XML).

The ATML project was driven by a desire to standardize the XML format for use by various proprietary tools used within the automatic test industry. This benefits ATS manufacturers, maintainers and users in a broad range of industries including aerospace and military. By using a common format, different tools and systems from different manufacturers can exchange information, and form co-operative heterogeneous systems.

The adoption of ATML will result in:

  • Improved portability of test requirements
  • Reduced repair cycle
  • Improved closed loop diagnostic systems
  • Formalised capture of results and other historic data
  • Support for exchange of test data in a distributed net-centric environment

ATML schemas are explained and defined in a series of related standards:

  • IEEE Std 1671, Base standard including the Common schema
  • IEEE Std 1671.1, ATML Test Description
  • IEEE Std 1671.2, ATML Instrument Description
  • IEEE Std 1671.3, ATML UUT Information
  • IEEE Std 1671.4, ATML Test Configuration
  • IEEE Std 1671.5, ATML Test Adapter Information
  • IEEE Std 1671.6, ATML Test Station Information
  • IEEE Std 1636.1, Test Results and Session Information

ATML also relies on the IEEE 1641 standard for signal definitions.

Our engineers have played a leading role in the development of the suite of ATML and associated standards. All of our toolsets that support IEEE 1641 are also compliant with the requirements of ATML.

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